Short test flashes produce large tilt aftereffects

作者: Jeremy M. Wolfe

DOI: 10.1016/0042-6989(84)90030-0

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摘要: Abstract Using a staircase method, the tilt aftereffect (TAE) was measured with test flashes of durations ranging from 10 to 600 msec. The TAE is largest brief duration stimuli and reaches an asymptotic value at flash 200–300 A series control experiments rule out variety explanations for this finding. decline in magnitude increasing not due decay, nor can large TAEs produced by be explained terms their lower effective luminance or contrast. results suggest that are processed different subset processes channels than longer stimuli.

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