Materials Characterization by Scanned Probe Analysis

摘要: The STM (see list of acronyms at end book) was invented by Binnig et al. in 1982 [1]. two main protagonists, G. and H. Rohrer, were subsequently awarded the Nobel Prize for physics. Thus began age SPM. Much early development excitement generated unequivocal demonstration spatial resolution on scale single atom local spectroscopies have been described literature [2–4]. rationale including a chapter SPM book surface analysis can be inferred from Fig. 10.1 (adapted Rohrer [5]). impact broad field interface science technology illustrated its prominence conference Birmingham September 1998, which brought together representative cross-section international community through 14th International Vacuum Congress, 10th Conference Solid Surfaces, 5th Nanometer-scale Science Technology Coference Quantitative Surface Analysis. Of some 1350 invited contributed papers approximately 20% based substantially techniques methodologies, while corresponding indices ‘traditional’ ‘other’ 34% 46%, respectively.