A combination of FD-TD and Prony's methods for analyzing microwave integrated circuits
作者： W.L. Ko , R. Mittra
DOI: 10.1109/22.106561
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摘要: It is demonstrated that, in applying the FD-TD (finite-difference time-domain) technique to analyze microwave integrated circuits, long time record required for generating accurate frequency-domain scattering parameters can be extrapolated from a relatively short by using Prony's method. As shown comparison with direct generated results, approach combination of and methods achieves same accuracy computed over much shorter time. >
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