Benchmarking Classification Models for Software Defect Prediction: A Proposed Framework and Novel Findings
作者： S. Lessmann , B. Baesens , C. Mues , S. Pietsch
DOI: 10.1109/TSE.2008.35
关键词:
摘要: … 3.1 Data Set Characteristics The data used in this study … Our view is that simple classifiers like Naive Bayes or decision … each arc represents a correlation or dependency. Thus, learning …
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