作者: Claude Amra , C. Grèzes-Besset , L. Bruel
DOI: 10.1364/AO.32.005492
关键词:
摘要: Electromagnetic theories provide a tool to detect the origin of scattering in optical multilayers. Illumination and observation conditions that cause surface bulk scatterings have different behaviors are pointed out. Angular, wavelength, polarization dependences investigated for location structural irregularities at interfaces or multilayer. Specific experiments can be designed.