作者: Reena Banga , Jack Yarwood , Anthony M. Morgan , Brian Evans , Jaqueline Kells
DOI: 10.1021/LA00011A036
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摘要: Atomic force microscopy (AFM) has been employed to study the adsorption of alkyl-and (perfluoroalkyl)-trichlorosilane molecules on silica substrates. The effect of surface coverage on …