Non-linear refractive index changes in CdHgTe at 175 K with 10.6μm radiation
作者： J.R. Hill , G. Parry , A. Miller
DOI: 10.1016/0030-4018(82)90111-0
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摘要: Abstract Measurement of power dependence the far field width an incident beam 10.6 μm radiation, with a gaussian profile, after passage through polished crystal Cd 0.21 Hg 0.79 Te at 175 K has led to observation non-linear refractive index change. The magnitude change was found be Δn = −(7.0 ± 3.5) × 10 −3 I 1 3 where is intensity in W/cm 2 . explained by predominant role Auger recombination limiting saturation band edge resonant absorption. position optical components prior sample also considered and shown fundamental importance interpretation results.
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