Optical detection of melting point depression for silver nanoparticles via in situ real time spectroscopic ellipsometry
作者： S. A. Little , T. Begou , R. W. Collins , S. Marsillac
DOI: 10.1063/1.3681367
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摘要: Silver nanoparticle films were deposited by sputtering at room temperature and annealed while monitoring real time spectroscopic ellipsometry (SE). The dielectric functions (0.75 eV–6.5 eV) obtained SE modeled using Lorentz generalized oscillators for the plasmon polariton (NPP) interband transitions, respectively. melting point could be identified from variations in oscillator parameters during annealing, this identification was further confirmed after cooling through significant, irreversible changes these relative to as-deposited film. variation with physical thickness, thus average diameter, as measured enables calculation of surface energy density.
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