Recent advances in nuclear and atomic spectrometric techniques for trace element analysis. A new look at the position of PIXE
作者： Willy Maenhaut
DOI: 10.1016/0168-583X(90)90304-D
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摘要: Abstract The principles, instrumentation and methodological aspects of several nuclear atomic spectrometric techniques for trace element analysis are briefly described. These activation analysis, mainly neutron (NAA), X-ray fluorescence (XRF), including total reflection XRF (TXRF) synchrotron radiation (SR-XRF), emission, absorption spectrometry (AES, AAS AFS), mass spectrometry, in particular inductively coupled plasma (ICP-MS). Recent advances new trends each technique indicated. various intercompared with other particle-induced emission (PIXE), this is done from a number viewpoints, cost the instrument and/or price per sample analyzed, speed type required capability multielement determinations, accuracy detection limits. Particular emphasis placed on assessing present position PIXE, it indicated what types analytical problems PIXE offers significant advantages over techniques.
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