作者: Brian C. O'Neill , Joseph H. Koestner , Frank M. Tappen , George A. Caccoma
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摘要: A batch chip placement system for positioning semiconductor chips, or the like, upon a substrate containing an array of sites footprints whose actual position on deviates from theoretical nominal over successive substrates. The is achieved by first sensing X and Y offsets pair alignment marks their to determine ΔX ΔY correction factors required obtain X,Y marks. used values, θ rotation shrinkage factor corrections proper orientation placement.