作者: Mojtaba Amjadipour , Jennifer MacLeod , Josh Lipton-Duffin , Anton Tadich , John J Boeckl
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摘要: The inelastic mean free path (IMFP) for carbon-based materials is notoriously challenging to model, and moving from bulk 2D may exacerbate this problem, making the accurate measurements of IMFP in carbon critical. overlayer-film method a common experimental estimate by measuring electron effective attenuation length (EAL). This estimation relies on an assumption that elastic scattering effects are negligible. We report here measurement EAL epitaxial graphene SiC using photoelectron spectroscopy over kinetic energy range 50–1150 eV. find significant effect interface between material substrate, indicating so-called 'buffer layer' smaller than free-standing graphene. Our results also suggest existing models estimating IMFPs not adequately capture physics interactions materials.