作者: J. M. Krijger , R. Snel , G. van Harten , J. H. H. Rietjens , I. Aben
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摘要: Abstract. We present a comprehensive model that can be employed to describe and correct for degradation of (scan) mirrors diffusers in satellite instruments suffer from changing optical Ultraviolet visible (UV–VIS) properties during their operational lifetime. As trend studies become more important, so does the importance understanding correcting this degradation. This is case not only with respect transmission components, but also wavelength, polarisation, or scan-angle effects. Our hypothesis flight deposition thin absorbing layer contaminant, which slowly builds up over time. Mueller matrix formalism Fresnel equations multi-layer contamination films. Special care taken avoid confusion often earlier publications concerning calculus out-of-plane reflections. The method applied any UV–VIS instrument. illustrate verify our approach behaviour multiple scan SCIAMACHY (onboard ENVISAT).