Enhanced Ferroelectric Property of P(VDF‐TrFE‐CTFE) Film Using Room‐Temperature Crystallization for High‐Performance Ferroelectric Device Applications
作者： Yuljae Cho , Docheon Ahn , Jong Bae Park , Sangyeon Pak , Sanghyo Lee
关键词:
摘要: … compared using XRD measurements as shown in Figure 2a. A TA film showed a sharp XRD peak at … The dielectric constant of the (PVDF-TrFE-CTFE) that was measured by the material …
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