Evaluation of error detection schemes using fault injection by heavy-ion radiation
作者： U. Gunneflo , J. Karlsson , J. Torin
关键词:
摘要: Several concurrent error detection schemes suitable for a watch-dog processor were evaluated by fault injection. Soft errors induced into MC6809E microprocessor heavy-ion radiation from Californium-252 source. Recordings of behavior used to characterize the as well determine coverage and latency various schemes. The recordings input programs that simulate detected up 79% all within 85 bus cycles. Fifty-eight percent caused execution diverge permanently correct program. best 99% these errors. Eighteen affected only data, was at most 38%. >
sci-hub.se 参考文章(9)
Satish M. Thatte, Thirumalai Sridhar, Concurrent Checking of Program Flow in VLSI Processors. international test conference. pp. 191- 199 ,(1982)
Masood Namjoo, Techniques for Concurrent Testing of VLSI Processor Operation. international test conference. pp. 461- 468 ,(1982)
Michael A. Schuette, John Paul Shen, On-Line Self-Monitoring Using Signatured Instruction Streams. international test conference. pp. 275- 282 ,(1983)
K. W. Li, J. R. Armstrong, J. G. Tront, An HDL Simulation of the Effects of Single Event Upsets on Microprocessor Program Flow IEEE Transactions on Nuclear Science. ,vol. 31, pp. 1139- 1144 ,(1984) , 10.1109/TNS.1984.4333471
A. Mahmood, E.J. McCluskey, Concurrent error detection using watchdog processors-a survey IEEE Transactions on Computers. ,vol. 37, pp. 160- 174 ,(1988) , 10.1109/12.2145
Donald K. Nichols, William E. Price, W. A. Kolasinski, R. Koga, James C. Pickel, James T. Blandford, A. E. Waskiewicz, Trends in Parts Susceptibility to Single Event Upset from Heavy Ions IEEE Transactions on Nuclear Science. ,vol. 32, pp. 4189- 4194 ,(1985) , 10.1109/TNS.1985.4334092
J. T. Blandford, J. C. Pickel, Use of CF-252 to Determine Parameters for SEU Rate Calculation IEEE Transactions on Nuclear Science. ,vol. 32, pp. 4282- 4286 ,(1985) , 10.1109/TNS.1985.4334109
J H Stephen, T K Sanderson, D Mapper, J Farren, R Harboe-Sorensen, L Adams, Cosmic Ray Simulation Experiments for the Study of Single Event Upsets and Latch-Up in CMOS Memories IEEE Transactions on Nuclear Science. ,vol. 30, pp. 4464- 4469 ,(1983) , 10.1109/TNS.1983.4333155
Lu, Watchdog Processors and Structural Integrity Checking IEEE Transactions on Computers. ,vol. 31, pp. 681- 685 ,(1982) , 10.1109/TC.1982.1676066