Radio frequency transceiver automatic test system
作者： Wang Hao , Wang Gang
DOI:
关键词:
摘要: The invention relates to a radio frequency transceiver automatic test system comprising modulator, power amplifier, divider, digital/analog converter, controller, and counter. An analog signal of is input the modulator. output end modulator connected amplifier. amplifier converter are comparator. comparator divider. divider controller via configurable division register, threshold further additional embedded into device process by transmitting part transceiver, so that cost for measuring very low, efficiency transceivers improved.
lens.org 参考文章(14)
Masao Nakadaira, Kazuo Ogasawara, Pll circuit, communication device, and loopback test method of communication device ,(2009)
Brandon R. Kam, Stephen D. Wyatt, Circuit and method for on-chip jitter measurement ,(2007)
Francois Lefevre, Integrated circuits with frequency generating circuits ,(2011)
Oren Eliezer, Chih-Ming Hung, Elida Isabel de Obaldia, Dirk Leipold, On-chip test mechanism for transceiver power amplifier and oscillator frequency ,(2004)
Hidehiko Kuroda, 秀彦 黒田, Semiconductor integrated circuit test device ,(2009)
Kenji Tamura, Testing device, testing method, and phase shifter ,(2010)
Wei Wei, Intelligent electric power parameter tester ,(2010)
Kristoffer Ellersgaard Koch, Frode Milch Pedersen, Erwin Dotzauer, Ronan Barzic, RC oscillator apparatus and circuit ,(2013)
Takanori Saiki, Clock control method and electric circuit ,(2002)
Xiaoyi Chen, Digital IC testing instrument and testing probe ,(1993)