搜索历史记录选项已关闭,请开启搜索历史记录选项。
作者: Kenji Murata
DOI: 10.1063/1.1663920
关键词:
摘要: … to the electron scattering theory in scanning electron microscopy. … The surface distribution of backscattered electrons is … From these results the exit areas of the backscattered electrons …
In Situ Characterization of Thin Film Growth,2011, 引用: 0
Science of Microscopy,2007, 引用: 12
Journal of Materials Science,2003, 引用: 9
Scanning Electron Microscopy,1985, 引用: 11
Advances in Electronics and Electron Physics Volume 62,1984, 引用: 2
Scanning Electron Microscopy, X-Ray Microanalysis, and Analytical Electron Microscopy,1990, 引用: 0
Electron Spectroscopy for Surface Analysis. Series: Topics in Current Physics,1977, 引用: 8
Surface and Interface Analysis,1980, 引用: 26
Surface and Interface Analysis,1979, 引用: 42
Rivista Del Nuovo Cimento,1992, 引用: 14