作者: Patrick C. Vaughan
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摘要: "This important new methodologically-oriented work represents a major step forward in the expanding field of traceological studies...The text is exceptionally well written and documented. Schematic artifacts line drawings ...clearly indicate different use zones on edges are preceded by coded use-type key. The 280 x photomicrographs section III exceptional as also presentation qualitative quantitative data." American Antiquity "Vaughan's monograph provides thorough treatment high-power microscopic approach to lithic use-wear analysis will contribute resolution this issue...An excellent introduction subject." North Arcaeologist