Nonlinear Time‐series Analysis Methods for the Evaluation & Study of Dynamical Phenomena in Atomic Force Microscopy Prediction of chaotic motion

摘要: Atomic Force Microscopy (AFM) is a widely used tool for nanoscale surface analysis. Dynamic atomic force microscopy (tapping or non‐contact mode) consists of vibrating microcantilever with tip that interacts sample via short‐ and long‐range intermolecular forces. Due to the need high precision measurements, interaction forces between nanotip specimen must be carefully examined analyzed in order best evaluate nonlinear dynamical response AFM system. Recent research on systems has focused detailed numerical analysis such possible chaotic regions can well defined. In this paper, time‐series methods (NTSA) are applied analyze signals generated by single‐degree‐of‐freedom lumped‐model dynamic‐mode AFM. The signal characteristics will provide useful insight system leading future work, evaluation deterministic uncertainty real‐time measurements that...