Chemistry and structure of CdO/Ag{222} heterophase interfaces.
作者： D. K. Chan , D. N. Seidman , K. L. Merkle
DOI: 10.1103/PHYSREVLETT.75.1118
关键词:
摘要: The atomic scale structure and chemistry of the terminating polar plane CdO, at atomically clean CdO/Ag{l_brace}222{r_brace} interfaces, produced by internal oxidation a Ag(Cd) alloy, is studied via high-resolution electron (HREM) atom-probe microscopies. It demonstrated that this {l_brace}222{r_brace} can be either O or Cd with equal probability. HREM results provide evidence for atomic-height steps interface. are explained in terms precipitate coarsening during process used to prepare interfaces.
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