作者: Waqar H. Shah , Yousaf Iqbal , Akif Safeen , Kashif Safeen , Gulzar Khan
DOI: 10.1142/S0217984918502810
关键词:
摘要: In this work, modification in structural and electrical properties of zirconium nitride (ZrN) thin films induced by silicon-ion irradiation is studied. ZrN are grown on glass substrate o...