Study of the structural and electrical properties of silicon ion irradiated zirconium nitride thin films

作者: Waqar H. Shah , Yousaf Iqbal , Akif Safeen , Kashif Safeen , Gulzar Khan

DOI: 10.1142/S0217984918502810

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摘要: In this work, modification in structural and electrical properties of zirconium nitride (ZrN) thin films induced by silicon-ion irradiation is studied. ZrN are grown on glass substrate o...

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