作者: L. CERVERA GONTARD , R.E. DUNIN-BORKOWSKI , D. OZKAYA
DOI: 10.1111/J.1365-2818.2008.02096.X
关键词:
摘要: High‐angle annular dark‐field scanning transmission electron microscopy tomography is applied to the study of Pt and PtCr nanoparticles supported on carbon black, which are used …