Grain Fragmentation in Equal Channel Angular Pressed Copper
作者： Cheng Fan Gu , László S Tóth , Benoit Beausir , Tim Williams , Chris HJ Davies
DOI: 10.4028/WWW.SCIENTIFIC.NET/MSF.654-656.1570
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摘要: A comparative experimental and simulation study of oxygen-free high conductivity copper produced by equal channel angular pressing (ECAP) one-pass has been carried out using electron backscatter diffraction (EBSD) a recently proposed grain refinement model. The size misorientation distributions were extracted from the EBSD measurements. It was found that microstructure in ECAP deformed much more refined on TD plane. observed experimentally can be fairly well predicted fragmentation
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