X-ray diffraction: a powerful method of characterizing nanomaterials

摘要: X-ray diffraction techniques are a very useful characterization tool to study, non-destructively, the crystallographic structure, chemical composition and physical properties of materials thin films. It can also be used measure various structural these crystalline phases such as strain, grain size, phase composition, defect structure. XRD is determine thickness films, well atomic arrangements in amorphous polymers. This paper reports importance technique for nanomaterials.