Interpretation of interfacial phenomena using schematic density profiles

作者: Paul D Fleming

DOI: 10.1016/0021-9797(78)90257-6

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摘要: Abstract The treatment of interfacial phenomena using schematic density profiles is discussed. It seen, for example, that the width and tension a single-component liquid—vapor interface can be characterized profiles. When critical point scaling theory applied to approximate expression surface obtained from profile, simple relation results. This says proportional kT ξ 2 , where correlation length. relation, which implied by “universality” concept more general than context it was derived, indicates tensions are low whenever large length exists. For Fisk—Widom scales properly in error only 8%. Schematic also lend themselves easily discussion activity. No excess occurs one-component system, course, but multicomponent systems manifestations absorption should emerge. unstable equilibrium associated with spherical interfaces pure system discussed terms seen droplets well defined so long as energy exceeds thermal energy. A similar applicable emulsion foam stability.

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