Calibration and evaluation of scanning-force-microscopy probes
作者： S. S. Sheiko , M. Möller , E. M. C. M. Reuvekamp , H. W. Zandbergen
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摘要: It is demonstrated that a stepped (305) surface of SrTiO3 crystal can be used routinely to evaluate the probing profile scanning-force-microscopy probes. This provides means select optimal probes, and possible image distortions within range atomic nanometer scale. The scope limitations resolution structural defects are discussed as criterion for true resolution.
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