The thickness dependence of ferroelectric and magnetic properties in epitaxial BiFeO3 thin films
作者： Q. Jiang , J. H. Qiu
DOI: 10.1063/1.2196238
关键词:
摘要: In the framework of a general Landau free energy function, which is used in conventional ferroelectrics, we investigate ferroelectric and magnetic properties multiferroic epitaxial BiFeO3 thin films. It shown that films, such as lattice parameter, polarization, magnetization, etc., are functions misfit strains. The film thickness dependence strains due to relaxation by dislocations during deposition incorporated into model using an effective substrate parameter. Therefore, films well explained.
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