Anderson Localization in Nb Al Superconducting Bilayers
作者： M. Greco , V. Lacquaniti , S. Maggi , E. Menichetti , G. Rinaudo
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摘要: We have measured the temperature dependence of resistivity in relatively thick Nb/Al bilayers fabricated at room temperature, observing decrease ρ for increasing T typical Anderson localization disordered systems. report experimental conditions which determine this behavior and compare it to theoretical models 3D
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