作者: Youngjong Ko , Vivek Raveendran , Markus Andresen , Marco Liserre
DOI: 10.1109/TPEL.2019.2931780
关键词:
摘要: Smart transformers (STs) are challenged by high-reliability requirements. Particularly, modular STs consist of a large number power semiconductors, and unevenly distributed thermal stress results in different remaining useful lifetimes the devices building blocks. This problem can be addressed with discontinuous modulation for medium-voltage-side converter, but coupled isolated dc–dc cells. For overcoming this drawback, article proposes an advanced modulation, which enables to manipulate cells independently. The algorithm is analyzed respect its capability manipulation validated experimentally junction temperature measurements. In addition, investigates impact on overall system's efficiency as well potential lifetime semiconductors