Inspection Using Shear Wave Time of Flight Diffraction (S‐TOFD) Technique
作者： G. Baskaran
DOI: 10.1063/1.2184516
关键词:
摘要: Ultrasonic Time of Flight Diffraction (TOFD) for sizing defects is based on the time flight longitudinal diffracted echo(es) that (arc) generated when a wave incident crack tip. TOFD technique so far has been commonly applied inspection thick sections (>15 mm) and thickness below 5 mm from scanning surface. This paper focuses applications to thin near surface inspections using shear echo (es) defect tips. Experimental result simulated realistic in samples will be presented.
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