Unreliable Silicon: Circuit through System-Level Techniques for Mitigating the Adverse Effects of Process Variation, Device Degradation and Environmental Conditions.
作者： Eric Alexander Karl
DOI:
关键词:
摘要:
参考文章(58)
David Kuck, Justin Rattner, Kevin Kahn, Shekhar Borkar, Pradeep Dubey, Hans Mulder, Steve Pawlowski, Platform 2015: Intel ® Processor and Platform Evolution for the Next Decade ,(2005)
M. Ershov, R. Lindley, S. Saxena, A. Shibkov, S. Minehane, J. Babcock, S. Winters, H. Karbasi, T. Yamashita, P. Clifton, M. Redford, Transient effects and characterization methodology of negative bias temperature instability in pMOS transistors international reliability physics symposium. pp. 606- 607 ,(2003) , 10.1109/RELPHY.2003.1197828
M. Denais, A. Bravaix, V. Huard, C. Parthasarathy, G. Ribes, F. Perrier, Y. Rey-Tauriac, N. Revil, On-the-fly characterization of NBTI in ultra-thin gate oxide PMOSFET's international electron devices meeting. pp. 109- 112 ,(2004) , 10.1109/IEDM.2004.1419080
Tak H. Ning, Yuan Taur, Fundamentals of Modern VLSI Devices ,(2004)
J.A. Maiz, Characterization of electromigration under bidirectional (BC) and pulsed unidirectional (PDC) currents international reliability physics symposium. pp. 220- 228 ,(1989) , 10.1109/RELPHY.1989.36349
A.J. Bhavnagarwala, S.V. Kosonocky, M. Immediato, D. Knebel, A.-M. Haen, A pico-joule class, 1 GHz, 32 KByte/spl times/64 b DSP SRAM with self reverse bias symposium on vlsi circuits. pp. 251- 252 ,(2003) , 10.1109/VLSIC.2003.1221218
J.H. Stathis, Physical and predictive models of ultra thin oxide reliability in CMOS devices and circuits international reliability physics symposium. pp. 132- 149 ,(2001) , 10.1109/RELPHY.2001.922893
Keith A Bowman, James W Tschanz, Nam Sung Kim, Janice C Lee, Chris B Wilkerson, Shih-Lien L Lu, Tanay Karnik, Vivek K De, None, Energy-Efficient and Metastability-Immune Timing-Error Detection and Instruction-Replay-Based Recovery Circuits for Dynamic-Variation Tolerance international solid-state circuits conference. pp. 402- 623 ,(2008) , 10.1109/ISSCC.2008.4523227
R.C. Blish, Temperature cycling and thermal shock failure rate modeling international reliability physics symposium. pp. 110- 117 ,(1997) , 10.1109/RELPHY.1997.584246
Sanjay V. Kumar, Chris H. Kim, Sachin S. Sapatnekar, An analytical model for negative bias temperature instability international conference on computer aided design. pp. 493- 496 ,(2006) , 10.1145/1233501.1233601