Detection and identification of microparticles occurring in a high‐voltage vacuum‐insulated gap using electron optical methods

摘要: According to Cranberg's hypothesis, tiny aggregates of metallic matter called microparticles, emanating from the electrode surfaces, are responsible for breakdown a vacuum gap under high dc stress. Experiments carried out using scanning electron microscope see whether such particles appear within interelectrode prior breakdown. It was observed that micron‐ and submicron‐sized released in abundance well below voltage. Investigations were continued identify microparticles with materials an microprobe analyzer. found composed materials. Direct examination after application voltage, also showed features suggesting surfaces.