Methods for determining characteristics of interface devices used with vector network analyzers

作者: Jon S. Martens

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摘要: Methods are provided for characterizing N interface devices (e.g., adapters or test fixture arms) using a vector network analyzer (VNA). These useful connecting an N-port device under (DUT) to the VNA. A first step of includes performing calibration at each outer reference planes. second inner set scattering-parameters (S-parameters) is then determined based on results calibrations performed and step. Each S-parameters characterizes respective one devices.

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