作者: Jon S. Martens
DOI:
关键词:
摘要: Methods are provided for characterizing N interface devices (e.g., adapters or test fixture arms) using a vector network analyzer (VNA). These useful connecting an N-port device under (DUT) to the VNA. A first step of includes performing calibration at each outer reference planes. second inner set scattering-parameters (S-parameters) is then determined based on results calibrations performed and step. Each S-parameters characterizes respective one devices.