AN AUGMENTED SPACE RECURSION STUDY OF THE ELECTRONIC STRUCTURE OF ROUGH EPITAXIAL OVERLAYERS
作者： A Mookerjee , Hemant G Salunke , Parthapratim Biswas , G P Das , A K Bhattacharyya
DOI: 10.1088/0953-8984/10/26/005
关键词:
摘要: In this communication we propose the use of augmented-space recursion as an ideal methodology for study electronic and magnetic structures rough surfaces, interfaces overlayers. The method can take into account roughness, short-ranged clustering effects, surface dilatation interdiffusion. We illustrate our by application to Fe overlayer on a Ag(100) surface.
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