A Scanning X-Ray Microscope Using Synchrotron Radiation

作者: P. Horowitz , J. A. Howell

DOI: 10.1126/SCIENCE.178.4061.608

关键词:

摘要: Focused synchrotron radiation collimated by means of a pinhole has been used to construct scanning x-ray microscope capable making stereoscopic element-discriminating pictures relatively thick specimens in an atmospheric environment.

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