作者: Hai-Pang Chiang , Jing-Lun Lin , Railing Chang , Sheng-Yu Su , Pui Tak Leung
DOI: 10.1364/OL.30.002727
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摘要: It is demonstrated that ultrahigh-resolution angular measurement can be achieved via surface-plasmon-resonance excitation in which the phase difference between p- and s-polarized reflected waves monitored as a function of incidence angle. Resolutions down to 1.9×10?6?deg are obtained by performing measurements at optimal incident wavelengths. This represents an order magnitude improvement compared with previously reported values.