Electrical Study of Trapped Charges in Copper-Doped Zinc Oxide Films by Scanning Probe Microscopy for Nonvolatile Memory Applications.
作者： Ting Su , Haifeng Zhang
DOI: 10.1371/JOURNAL.PONE.0171050
关键词:
摘要: Charge trapping properties of electrons and holes in copper-doped zinc oxide (ZnO:Cu) films have been studied by scanning probe microscopy. We investigated the surface potential dependence on voltage duration applied to ZnO Kelvin force It is found that Fermi Level 8 at.% Cu-doped shifted 0.53 eV comparing undoped films. This shift indicates significant change electronic structure energy balance The (work function) can be tuned Cu doping, which are important for developing this functional material. In addition, microscopy measurements demonstrate nature contact at Pt-coated tip/ZnO:Cu interface changed from Schottky Ohmic increasing sufficient amount ions. charge property enhance greatly doping (~10 at.%). improved stable bipolar indicate promising nonvolatile memory applications.
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Long Wen, Manish Kumar, BB Sahu, SB Jin, C Sawangrat, K Leksakul, JG Han, None, Advantage of dual-confined plasmas over conventional and facing-target plasmas for improving transparent-conductive properties in Al doped ZnO thin films Surface & Coatings Technology. ,vol. 284, pp. 85- 89 ,(2015) , 10.1016/J.SURFCOAT.2015.06.084
Manish Kumar, Long Wen, Bibhuti B Sahu, Jeon Geon Han, None, Simultaneous enhancement of carrier mobility and concentration via tailoring of Al-chemical states in Al-ZnO thin films Applied Physics Letters. ,vol. 106, pp. 241903- ,(2015) , 10.1063/1.4922732
M Younas, Junying Shen, Mingquan He, R Lortz, Fahad Azad, MJ Akhtar, Asghari Maqsood, Francis CC Ling, Role of multivalent Cu, oxygen vacancies and CuO nanophase in the ferromagnetic properties of ZnO:Cu thin films RSC Advances. ,vol. 5, pp. 55648- 55657 ,(2015) , 10.1039/C5RA09002D
Chun-Chung Chen, Chia-Chi Chang, Zhen Li, AFJ Levi, Stephen B Cronin, None, Gate tunable graphene-silicon Ohmic/Schottky contacts Applied Physics Letters. ,vol. 101, pp. 223113- ,(2012) , 10.1063/1.4768921
M. Nonnenmacher, M. P. O’Boyle, H. K. Wickramasinghe, Kelvin probe force microscopy Applied Physics Letters. ,vol. 58, pp. 2921- 2923 ,(1991) , 10.1063/1.105227
M. C. Recker, J. W. McClory, M. S. Holston, E. M. Golden, N. C. Giles, L. E. Halliburton, Copper doping of ZnO crystals by transmutation of 64Zn to 65Cu: An electron paramagnetic resonance and gamma spectroscopy study Journal of Applied Physics. ,vol. 115, pp. 243706- ,(2014) , 10.1063/1.4885439
Wilhelm Melitz, Jian Shen, Andrew C. Kummel, Sangyeob Lee, Kelvin probe force microscopy and its application Surface Science Reports. ,vol. 66, pp. 1- 27 ,(2011) , 10.1016/J.SURFREP.2010.10.001
V. Palermo, M. Palma, P. Samorì, Electronic Characterization of Organic Thin Films by Kelvin Probe Force Microscopy Advanced Materials. ,vol. 18, pp. 145- 164 ,(2006) , 10.1002/ADMA.200501394
Wen Dai, Xinhua Pan, Cong Chen, Shanshan Chen, Wei Chen, Honghai Zhang, Zhizhen Ye, Enhanced UV detection performance using a Cu-doped ZnO nanorod array film RSC Advances. ,vol. 4, pp. 31969- 31972 ,(2014) , 10.1039/C4RA04249B
Masahiko Ando, Seiji Heike, Masahiro Kawasaki, Tomihiro Hashizume, Trapped charge mapping in crystalline organic transistors by using scanning Kelvin probe force microscopy Applied Physics Letters. ,vol. 105, pp. 193303- ,(2014) , 10.1063/1.4901946