Pulsed radiofrequency glow discharge time‐of‐flight mass spectrometry for molecular depth profiling of polymer‐based films
作者： Nunzio Tuccitto , Lara Lobo , Agnès Tempez , Ivan Delfanti , Patrick Chapon
DOI: 10.1002/RCM.3906
关键词:
摘要: We demonstrate the potential of an innovative technique, pulsed radiofrequency glow discharge time-of-flight mass spectrometry, for molecular depth profiling polymer materials. The technique benefits from presence, in afterglow discharge, fragment ions that can be related to structures polymers under study. Thin films different (PMMA, PET, PAMS, PS) were successfully profiled with retention information along profile. Multilayered above also profiled, and it was possible discriminate among layers having similar elemental composition but structure.
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