Spectroscopy of silica layers containing Si nanocrystals: Experimental evidence of optical birefringence

摘要: We report an unusual case of spectral filtering by a silica waveguide containing Si nanocrystals (Si-nc’s) deposited on plate. For number Si-rich (SiOx) slab waveguides annealed at 1100°C, the TE and TM mode cutoff positions are found in inversed order with respect to classical theory for isotropic material. Using m-line spectra, this behavior was explained assuming optical birefringence highest content (x∼1.5), we estimated maximal positive ∼8%. The spectrum simulated parameters extracted from measurements corresponds well directly obtained measuring waveguided luminescence. This agreement shows that effect layers Si-nc can be described within quantitative model delocalized modes. possible origin observed is discussed.