New Insights into Dielectric Breakdown of MgO in STT-MRAM Devices
作者： Kin Leong Pey , Jia Hao Lim , Nagarajan Raghavan , Sen Mei , Jae Hyun Kwon
DOI: 10.1109/EDTM.2019.8731071
关键词:
摘要: In a comprehensive analytical study of dielectric breakdown (BD) of ultra-thin MgO in 28 nm embedded MRAM (eMRAM) test chips, it was observed that breakdown in MgO is polarity …
sci-hub.se 参考文章(1)
Artur Antonyan, Suksoo Pyo, Hyuntaek Jung, Taejoong Song, Embedded MRAM Macro for eFlash Replacement 2018 IEEE International Symposium on Circuits and Systems (ISCAS). pp. 1- 4 ,(2018) , 10.1109/ISCAS.2018.8351201