作者: Rupali N. Jadhav , Vijaya Puri
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摘要: The effect of copper on the microwave absorption, conductivity and complex permittivity fritless Ni(1−x)CuxMn2O4 (x = 0, 0.4, 0.8, 1) thick film alumina have been investigated in 8–18GHz frequency range. structural changes identified by scanning electron microscope (SEM), FTIR RAMAN scattering spectroscopy. increase as content increases. (0 ≤ x with 0.4 shows best absorption properties, though all other compositions also show good a large increases from 1S/cm to 951 S/cm due dielectric constant (έ) 7 19.5.