Atomic scale memory at a silicon surface

作者: R Bennewitz , J N Crain , A Kirakosian , J-L Lin , J L McChesney

DOI: 10.1088/0957-4484/13/4/312

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摘要: The limits of pushing storage density to the atomic scale are explored with a memory that stores bit by presence or absence one silicon atom. These atoms positioned at lattice sites along self-assembled tracks pitch five atom rows. can be initialized and reformatted controlled deposition silicon. writing process involves transfer Si tip scanning tunnelling microscope. constraints on speed reliability compared data in magnetic hard disks DNA.

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