作者: Jana Šmilauerová , Petr Harcuba , Miroslav Cieslar , Miloš Janeček , Václav Holý
DOI: 10.1107/S2053273319008428
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摘要: Anomalous X-ray diffraction (AXRD) is a technique which makes use of effects occurring near the energy an absorption edge element present in studied sample. The intensity diffracted radiation exhibits anomalous decrease when primary beam matches needed to excite electron from atomic orbital. characteristics this step are sensitive concentration `anomalous' and its spatial distribution In investigation, AXRD was employed study ω particles metastable β titanium alloy Ti-15Mo (in wt%). experiments were done range around Mo K at 20.0 keV, allowing investigation material, rejected volume during their diffusion-driven growth. This paper deals with diffuse scattering patterns (006)β maximum. It observed that different regions exhibited variations incident photon edge. Numerical simulations as well dependences scattered performed. found dependence on can be explained by taking into account (a) elastic deformation matrix arising presence slightly misfitting (b) `cloud' higher particles.