Comparison of friction measurements using the atomic force microscope and the surface forces apparatus: the issue of scale

作者: Patricia M. McGuiggan , Jun Zhang , Stephen M. Hsu

DOI: 10.1023/A:1016692704748

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摘要: Results are presented of lateral force measurements using the atomic microscope (AFM) and surface forces apparatus (SFA). Two different probes used in AFM measurements; a sharp silicon nitride tip (radius R≈20 nm) glass ball (R≈15 μm). The is measured between (silicon or glass) probe mica which has been coated by thin lubricant film. In SFA, film separates two molecularly smooth surfaces (R≈1 cm) slid relative to each other. Perfluoropolyether (PFPE) polydimethylsiloxane (PDMS) were as films. SFA where contact diameter largest, PFPE shows much lower friction than PDMS. As size decreases, difference decreases. For tips, no clear distinction tribological properties films can be made. Hence, coefficient varies according length scale probed, at least for small dimensions.

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