A projective framework for radiometric image analysis

作者: Ping Tan , Todd Zickler

DOI: 10.1109/CVPR.2009.5206731

关键词:

摘要: Different materials reflect light in different ways, and reflectance interacts with shape, lighting, viewpoint to determine an object's image. Common exhibit diverse effects, this is a significant source of difficulty for radiometric image analysis. One strategy dealing diversity build computational tools that exploit symmetries, such as reciprocity isotropy, are exhibited by broad classes materials. In paper, we advocate the real projective plane tool representing exploiting these symmetries. approach, each point represents surface normal visible from fixed viewpoint, symmetries analyzed terms geometric structures they induce. We provide overview explore applications both calibrated uncalibrated photometric stereo.

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