KOPSKO: a Computer Program for Generation of Kossel and Pseudo Kossel Diffraction Patterns

摘要: Diffraction techniques are widely used especially as additional tools for analytical microprobe analysis. A supplementary device to a scanning electron microscope (SEM) allows taking of X-ray lattice source and wide angle interference patterns, now termed Kossel Pseudo respectively, in transmission back reflection arrangement reported by DABRITZ et al. (1986, 1997a,b). The developed program KOPSKO simulates exactly the entire system diffraction patterns basing on geometric theory. It permits phase, orientation, structure determination. present paper shows range possibilities using computerized analysis this field. Initially it deals with simulation which excellent suitable precise determination constants micro instance. new way three dimensional vector algebra calculate reflections point procedure is presented second part. attained coincidence experimentally taken relatively easy crystallographic data mono- polycrystals. Particularly designed determine precisely, complex divergent beam interferences, too. Through takes into account shade originated target holder. Moreover, enables localization imperfections well consideration grain size effects lead interruptions lines. By polycrystalline materials study such specimens essentially simplified.