作者: C.H Marrows , B.J Hickey , M Herrmann , S McVitie , J.N Chapman
DOI: 10.1016/S0304-8853(98)01136-6
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摘要: The giant magnetoresistance (GMR) of sputtered Co/Cu multilayers is reduced when they are not grown in clean vacuum conditions and earlier work has shown that the most easily damaged parts multilayer Cu spacer layers. We have prepared samples with dirty spacers examined magnetisation reversal mechanism as a function applied field direction by magneto-optic Kerr effect Lorentz electron microscopy. Whilst an uniaxial anisotropy induced during growth process, its on films high GMR small. By contrast low behaviour gas highly anisotropic. Quite different domain configurations observed two kinds film, indicative dominant coupling mechanisms.