Optical and structural evidence of the grain-boundary influence on the disorder of polycrystalline CdTe films
作者： A. Iribarren , R. Castro-Rodrı́guez , F. Caballero-Briones , J. L. Peña
DOI: 10.1063/1.123978
关键词:
摘要: We report the linear behavior of band-tail parameter as a function reciprocal grain size in polycrystalline CdTe. On other hand, study full width at half maximum x-ray diffraction peak shows similar behavior, which indicates that disorder increases diminishes. A theoretical analysis justifies is ruled by contribution grain-boundary traps, and trap concentration calculated. Both results constitute experimental evidences disorder, was quantified, demonstrate it caused extension effect into grain.
harvard.edu
scitation.org
aip.org 
sci-hub.se 参考文章(14)
Bernard Dennis Cullity, Elements of X-ray diffraction ,(1956)
M. Bujatti, F. Marcelja, Absorption edge of CdS thin films Thin Solid Films. ,vol. 11, pp. 249- 258 ,(1972) , 10.1016/0040-6090(72)90051-X
A. Iribarren, R. Castro-Rodríguez, V. Sosa, J. L. Peña, Band-tail parameter modeling in semiconductor materials Physical Review B. ,vol. 58, pp. 1907- 1911 ,(1998) , 10.1103/PHYSREVB.58.1907
T. W. Kim, H. L. Park, J. Y. Lee, The effect of a ZnTe buffer layer on the structural and optical properties of the CdTe/ZnTe/GaAs strained heterostructures grown by temperature‐gradient vapor‐transport deposition Applied Physics Letters. ,vol. 67, pp. 2388- 2390 ,(1995) , 10.1063/1.114556
Y. Rosenwaks, A. J. Nozik, I. Yavneh, The effect of electric fields on time-resolved photoluminescence spectra in semiconductors Journal of Applied Physics. ,vol. 75, pp. 4255- 4257 ,(1994) , 10.1063/1.355964
R. Cohen, V. Lyahovitskaya, E. Poles, A. Liu, Y. Rosenwaks, Unusually low surface recombination and long bulk lifetime in n-CdTe single crystals Applied Physics Letters. ,vol. 73, pp. 1400- 1402 ,(1998) , 10.1063/1.122169
J Dutta, D Bhattacharyya, AB Maiti, S Chaudhuri, AK Pal, Studies of the grain boundary effect in electrodeposited cadmium telluride films from optical measurements Vacuum. ,vol. 46, pp. 17- 22 ,(1995) , 10.1016/0042-207X(95)80053-0
M. A. Schneider, M. Wenderoth, A. J. Heinrich, M. A. Rosentreter, R. G. Ulbrich, Current transport through single grain boundaries: A scanning tunneling potentiometry study Applied Physics Letters. ,vol. 69, pp. 1327- 1329 ,(1996) , 10.1063/1.117583
B. I. Halperin, Melvin Lax, Impurity-Band Tails in the High-Density Limit. I. Minimum Counting Methods Physical Review. ,vol. 148, pp. 722- 740 ,(1966) , 10.1103/PHYSREV.148.722
John Y. W. Seto, The electrical properties of polycrystalline silicon films Journal of Applied Physics. ,vol. 46, pp. 5247- 5254 ,(1975) , 10.1063/1.321593