Polymer Dynamics in Thin Films
作者： J. L. Keddie , R. A. Cory , R. A. L. Jones
DOI: 10.1007/978-94-011-6582-2_13
关键词:
摘要: Spectroscopic ellipsometry has been used to measure the glass transition temperature of thin polymer films. Polystyrene films on a silicon substrate show substantial molecular weight independent depression for decreasing thickness. Poly (methyl methacrylate) an increase when prepared native oxide surface, but decrease gold substrates. The competing roles free interactions with and finite size effects in determining dynamics polymers confined geometries are discussed.
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