Electron Backscatter Diffraction: A Powerful Tool for Phase Identification in the SEM

作者: J. R. Michael , R. P. Goehner

DOI: 10.1557/PROC-589-39

关键词:

摘要: EBSD in the SEM has been developed into a tool that can provide identification of unknown crystalline phases with spatial resolution is better than one micrometer. This technique applied to wide range materials. Use HOLZ rings patterns enabled reduced unit cell be determined from unidexed patterns. paper introduces for phase and illustrates examples metal joining particle analysis. Reduced determination then discussed.

参考文章(4)
R.P. Goehner, J.R. Michael, Phase Identification in a Scanning Electron Microscope Using Backscattered Electron Kikuchi Patterns. Journal of Research of the National Institute of Standards and Technology. ,vol. 101, pp. 301- 308 ,(1996) , 10.6028/JRES.101.031