Broadband omnidirectional antireflection coatings optimized by genetic algorithm

作者: David J. Poxson , Martin F. Schubert , Frank W. Mont , E. F. Schubert , Jong Kyu Kim

DOI: 10.1364/OL.34.000728

关键词:

摘要: An optimized graded-refractive-index (GRIN) antireflection (AR) coating with broadband and omnidirectional characteristics—as desired for solar cell applications—designed by a genetic algorithm is presented. The three-layer GRIN AR consists of dense TiO2 two nanoporous SiO2 layers fabricated using oblique-angle deposition. normal incidence reflectance the averaged between 400 700 nm 3.9%, which 37% lower than that conventional single-layer Si3N4 coating. Furthermore, measured reflection over 410-740 range wide incident angles 40°-80° reduced 73% in comparison coating, clearly showing enhanced omnidirectionality characteristics

参考文章(9)
Martin F. Schubert, Frank W. Mont, Sameer Chhajed, David J. Poxson, Jong Kyu Kim, E. Fred Schubert, Design of multilayer antireflection coatings made from co-sputtered and low-refractive-index materials by genetic algorithm. Optics Express. ,vol. 16, pp. 5290- 5298 ,(2008) , 10.1364/OE.16.005290
J. K. Kim, S. Chhajed, M. F. Schubert, E. F. Schubert, A. J. Fischer, M. H. Crawford, J. Cho, H. Kim, C. Sone, Light-Extraction Enhancement of GaInN Light-Emitting Diodes by Graded-Refractive-Index Indium Tin Oxide Anti-Reflection Contact† Advanced Materials. ,vol. 20, pp. 801- 804 ,(2008) , 10.1002/ADMA.200701015
Mei-Ling Kuo, David J. Poxson, Yong Sung Kim, Frank W. Mont, Jong Kyu Kim, E. Fred Schubert, Shawn-Yu Lin, Realization of a near-perfect antireflection coating for silicon solar energy utilization Optics Letters. ,vol. 33, pp. 2527- 2529 ,(2008) , 10.1364/OL.33.002527
W. H. Southwell, Gradient-index antireflection coatings. Optics Letters. ,vol. 8, pp. 584- 586 ,(1983) , 10.1364/OL.8.000584
Minfeng Chen, Hung-chun Chang, Allan S. P. Chang, Shawn-Yu Lin, J.-Q. Xi, E. F. Schubert, Design of optical path for wide-angle gradient-index antireflection coatings Applied Optics. ,vol. 46, pp. 6533- 6538 ,(2007) , 10.1364/AO.46.006533
D. J. Poxson, F. W. Mont, M. F. Schubert, J. K. Kim, E. F. Schubert, Quantification of porosity and deposition rate of nanoporous films grown by oblique-angle deposition Applied Physics Letters. ,vol. 93, pp. 101914- ,(2008) , 10.1063/1.2981690
Daniel Poitras, J. A. Dobrowolski, Toward perfect antireflection coatings. 2. Theory. Applied Optics. ,vol. 43, pp. 1286- 1295 ,(2004) , 10.1364/AO.43.001286
J.-Q. Xi, Martin F. Schubert, Jong Kyu Kim, E. Fred Schubert, Minfeng Chen, Shawn-Yu Lin, W. Liu, J. A. Smart, Optical thin-film materials with low refractive index for broadband elimination of Fresnel reflection Nature Photonics. ,vol. 1, pp. 176- 179 ,(2007) , 10.1038/NPHOTON.2007.26
Scott R. Kennedy, Michael J. Brett, Porous broadband antireflection coating by glancing angle deposition. Applied Optics. ,vol. 42, pp. 4573- 4579 ,(2003) , 10.1364/AO.42.004573